Advantest R5372P MICROWAVE COUNTER
Advantest R5372P MICROWAVE COUNTER
Power Semiconductor Tester Platform
MT System is a configurable test equipment suitable to verify static and dynamic parameters of power semiconductors (i.e. IGBT, MOSFET, DIODE, THYRISTOR) including the latest Wide Bandgap device technologies (Silicon carbide (SiC), Gallium nitride (GaN), etc.)
Specific tester configuration and ranges allow full coverage of device typologies reaching up to 10KV-10KA on static tests and 6KV-18KA on dynamic test.
MT Family
MT System is a configurable test equipment suitable to verify static and dynamic parameters of power semiconductors (i.e. IGBT, MOSFET, DIODE, THYRISTOR) including the latest Wide Bandgap device technologies (SiC, GaN, etc).
Specific tester configuration and ranges allow full coverage of device typologies reaching up to 10KV-10KA on static tests and 6KV-18KA on dynamic test.
![]()
Advantages and Benefits
MT tester family enables outstanding power device test coverage and CoT advantages.
Unique tester’s family able to cover all the production phases:
- Wafer sort test requirement
- Single die test requirement (KGD)
- Substrates (DBC/AMB) testing
- Packaged components, from discrete up to complex modules