Advantest BGD-023054 BGD023054 PCB Board
Advantest BGD-023054 BGD023054 PCB Board
While chipmakers enhance the functionality of semiconductor devices and increase multi-functionality, they need to reduce development times. Advantest’s T2000 is ideal for testing these devices.
Time to Market Reduction – Multi-Session
The T2000 makes it possible to develop device test programs efficiently with minimal investment. With the multi-site CPU architecture unique to the T2000. multiple users can log in to a single test system at the same time, and perform debugging work independently. Up to eight people can work simultaneously, contributing to both engineering cost savings and TTM reduction. In addition, eight people can develop separate functions for the same device concurrently, which greatly shortens development times.
Best-In-Class Parallel Test Efficiency – Multi-Site Controller
As more DUTs (Devices Under Test) are measured simultaneously, overhead tends to increase, and test times in general tend to be longer. However, the T2000 reduces test time and achieves high throughput with highly efficient multi-site test technology that completely eliminates overhead.
Test Time Reduction – Concurrent Test
The T2000 supports concurrent test functionality which can execute complex device test in shorter times. Concurrent test can be more easily achieved than in the past, as the T2000 can seamlessly switch between sequential execution and parallel execution of multiple test items. In addition, its concurrent test functionality enables users to rapidly develop test programs with short test times.
Test Cost Reduction
With up to 8.192 digital channels, the T2000 achieves more than twice the parallelism of the previous model, reducing test cost.
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