Advantest BGD-022242 BB BOARD
Advantest BGD-022242 BB BOARD
Synchronization available up to 325 GHz
■ Resolution bandwidth (RBW):
10 Hz to 10 MHz, 5MHz (analog)
1 Hz to 100 Hz (digital)
■ Wide dynamic range:-145dBc/Hz (2GHz band, typ.)
70dB or better for W-CDMA ACP measurement (5MHz offset, typ.)
■ 1µs fast zero-span sweep
■ Simplified, Automated measurements for mobile communications
■ Digital modulation analysis options for 1G, 2G, and 3rd
The R6552 Series is a digital multimeter designed for system or bench use with the maximum display of 319999.
featuring GPIB and RS232 interfaces with full remote control capability.
It is capable of measuring DC voltage/current, AC voltage/ current, 4- or 2-wire resistance,
low/power 4- or 2-wire resistance, (AC+DC) AC voltage/current, frequencies, and diodes.
ADVANTEST’s unique multi-slope integral A/D conversion method ensures high speed and high precision measurements.
The AC voltage/current measurement uses the true-RMS (true effective value) method while
the (AC+DC) AC voltage/current measurement allows measurement of a true effective
value of the distortion wave including the DC components.
Generation : PHS, PDC, IS-136. GSM, DECT, EDGE, GPRS IS-95. W-CDMA/3GPP, cdma2000. Bluetooth
The Advantest R3267 spectrum analyzers provide accurate, repeatable measurements of high-quality
digital signals in the 2GHz band ± within 1% frequency span accuracy and -154dBc/Hz dynamic range (typical).
In addition, its 10Hz to 10MHz resolution band with filters is capable of performing 70dB (typical, 5MHz offset)
ACP measurements over W-CDMA, making it ideal for testing wideband signals.
Finally, the R3267 has a frequency range of 100Hz to 8GHz, allowing even high-frequency systems to be fully measured.
The front panel of the R3267 consists of the Display section, Power Switch/Connector section,
Floppy Disk Drive section, Measurement section, Marker section, Save/Recall section, Display Control section,
ENTRY section, REMOTE section, Control section, and Option section.
Integrated Power Device Test Solution
We provide solutions for high-performance, high-throughput testing of devices for automotive, industrial and power management applications.
Setting a New Standard
High flexibility and ease-of-use due to a multi-functional mixed-signal architecture.
Low cost of test with high parallelism.
Increased throughput with pattern-controlled test conditions.
Enhanced test efficiency using per-channel time measurements.
Simple load board Design by Cross function port and matrix functionality.
Best-in-class performance, including fast range switching hardware, fast switching relays and concurrent hardware operation.
Simplified coding enabled by the rapid development kit (RDK) software package, which provides a user-friendly environment for developing reusable code and implementing fast debugging.
Wide coverage for testing on the same platform, from low-voltage communication PMICs to high-voltage automotive ASSPs.